Characterization of morphological, optical, and electrophysical properties of Cu₂O Thin films obtained by RF sputtering

SUMAN, V.; MORARI, V.; BRAGARI, D.; MONAICO, E.; GHIMPU, L.; RUSU, E.; MONAICO, E. V.

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dc.contributor.author	SUMAN, V.
dc.contributor.author	MORARI, V.
dc.contributor.author	BRAGARI, D.
dc.contributor.author	MONAICO, E.
dc.contributor.author	GHIMPU, L.
dc.contributor.author	RUSU, E.
dc.contributor.author	MONAICO, E. V.
dc.date.accessioned	2026-10-13T17:11:04Z
dc.date.available	2026-10-13T17:11:04Z
dc.date.issued	2026
dc.identifier.citation	SUMAN, V.; V. MORARI; D. BRAGARI; E. MONAICO; L. GHIMPU; E. RUSU and E. V. MONAICO. Characterization of morphological, optical, and electrophysical properties of Cu₂O Thin films obtained by RF sputtering. In: 10th International Symposium on Dielectric Materials and Application, Abstract Book, ISyDMA’10, Chisinau, Republic of Moldova, 30 June -4 July, 2026. Technical University of Moldova. Chişinău: 2026, p. 52.	en_US
dc.identifier.uri	https://repository.utm.md/handle/5014/37369
dc.description	This work was supported by the institutional subprograms #02.02.01 no. 4/FI „Nanostructures and advanced materials for applications in spintronics, thermoelectricity and optoelectronics” and Stimulating Excellence in Research 2025–2026: #25.80012.5007.88SE – Tandem solar cells based on Cu₂O heterojunctions.	en_US
dc.description.abstract	Metal oxide semiconductors, owing to their versatile electronic properties, are essential materials for a wide range of applications, including photovoltaic and photoelectrochemical cells, photodetectors, and power electronic devices. Their functionality as selective charge transport layers or light absorbers is determined by their electrical conductivity, work function, and band gap. Copper oxide (Cu₂O), a p-type semiconductor with a band gap in the range of 1.9–2.6 eV, has attracted significant attention as a hole transport layer in perovskite solar cells due to its promising efficiency and stability.	en_US
dc.language.iso	en	en_US
dc.publisher	Technical University of Moldova	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	rf magnetron	en_US
dc.subject	raman spectroscopy	en_US
dc.title	Characterization of morphological, optical, and electrophysical properties of Cu₂O Thin films obtained by RF sputtering	en_US
dc.type	Article	en_US