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Effect of Zn:Sn stoichiometry on the morphological and electrical properties of Aerosol Deposited ZnSnO Films

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dc.contributor.author MORARI, V.
dc.contributor.author RUSU, V. EMIL
dc.contributor.author GHIMPU, L.
dc.date.accessioned 2026-01-23T08:19:47Z
dc.date.available 2026-01-23T08:19:47Z
dc.date.issued 2025
dc.identifier.citation MORARI V.; V. EMIL RUSU and L. GHIMPU. Effect of Zn:Sn stoichiometry on the morphological and electrical properties of Aerosol Deposited ZnSnO Films. In: ICAMT 2025: the International Conference on Advanced Materials and Technologies: Book of Abstracts, Tbilisi, Georgia, 15-17 October, 2025. Tbilisi, 2025, pp. 68-69. en_US
dc.identifier.uri https://repository.utm.md/handle/5014/34870
dc.description Only Abstract. en_US
dc.description.abstract Zinc tin oxide (ZnSnO) is a ternary oxide semiconductor that has gained increasing attention due to its wide band gap, typically around 3.5 to 4.0 eV, depending on the specific stoichiometry of the material, good transparency in the visible range, and potential for n-type conductivity. These characteristics make ZnSnO a promising candidate for applications including thin-film transistors, solar cells, and sensors [1]. ZnSnO combines the properties of its binary components, ZnO and SnO₂, offering enhanced control over electrical and optical behavior through stoichiometric tuning. Among the various deposition techniques, aerosol spray pyrolysis stands out as a cost-effective and scalable method for producing uniform thin films. In this study, we investigated the influence of Zn:Sn stoichiometric ratios (1:2 and 2:1) on the morphological and electrical properties of ZnSnO thin films deposited by aerosol spray onto p-type silicon substrates. Scanning electron microscopy (SEM) images revealed that the obtained samples exhibit uniform surface coverage, though the crystallite morphology significantly depends on the Zn:Sn ratio. For Zn:Sn = 2:1, well-defined crystallites with sizes ranging from 100–150 nm were observed. In contrast, the sample with Zn:Sn = 1:2 presented irregular, disordered structures. The current-voltage characteristics of the ZnSnO films was analyzed under both dark and illuminated conditions (100 mW/cm²). For the sample with Zn:Sn = 2:1, the semilogarithmic I–V plot demonstrated a saturation current Is = 8.8 mA and an ideality factor n = 2.6, suggesting a charge transport mechanism dominated by recombination in the depletion region, along with additional parasitic effects such as trap-assisted tunneling. Concerning Zn:Sn = 1:2, the extracted parameters were Is = 1.6 µA and n = 1.4, indicating a diffusion-dominated transport mechanism with contributions from junction recombination. Besides this, a higher saturation current (e.g., 8.8 mA) could be more efficient for applications where rapid photoresponse and high conductivity are more prioritized than detecting extremely low concentrations (e.g.,1.6 µA). These findings demonstrate that varying the Zn:Sn stoichiometry significantly influences both the morphology and electrical performance of ZnSnO films, enabling targeted optimization for specific device applications. en_US
dc.language.iso en en_US
dc.publisher LEPL Ilia Vekua Sukhumi Institute of Physics and Technology en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject ZnSnO en_US
dc.subject SEM en_US
dc.subject I-V characteristics en_US
dc.subject charge carrier transport en_US
dc.title Effect of Zn:Sn stoichiometry on the morphological and electrical properties of Aerosol Deposited ZnSnO Films en_US
dc.type Article en_US


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