Proceedings of the 4th Edition of European Exhibition of Creativity and Innovation, Romania https://repository.utm.md/handle/5014/20964 2026-04-20T06:04:32Z 2026-04-20T06:04:32Z DOROGAN, A. DOROGAN, V. PARVAN, V. SÎRBU, N. https://repository.utm.md/handle/5014/21003 2022-09-02T10:28:11Z 2012-01-01T00:00:00Z

Determination of refractive index in planar waveguides DOROGAN, A.; DOROGAN, V.; PARVAN, V.; SÎRBU, N. Nanolayered waveguides with quantum wells possess birefringence properties, even those based on isotropic materials. The most sensitive methods of studying birefringence properties in nanowaveguides are the methods of interference spectroscopy. A typical image of interference can be observed in the interference spectra of birefringent nanostructures. The elaborated method permits to analyze the spectral dependence of the refractive index for the ordinary (Ер) and extraordinary (Еs) lightwaves from absorption or reflection interference spectra of nanolayers. The maxima and minima positions of the interference spectra can be determined using simple PC software „Origin”. Patent pending. Exibits Clasification: Class no. 10 Information Technology and Communication

2012-01-01T00:00:00Z DOROGAN, A. DOROGAN, V. VIERU, T. SÎRBU, A. SÎRBU, N. ZALOMAI, V. https://repository.utm.md/handle/5014/21002 2022-09-02T10:11:23Z 2012-01-01T00:00:00Z

Method of determining the quality of nanostructures DOROGAN, A.; DOROGAN, V.; VIERU, T.; SÎRBU, A.; SÎRBU, N.; ZALOMAI, V. An analysis method of nanostructures’ quality had been developed using the calculation of optic reflection spectra according to the dispersion relations of the multiple oscillators method applied to the excitonic polaritons [1, 2]. The method permits to determine the dumping factor, which characterizes the layers’ quality, the structure perfection and, also, the oscillators force of electronic transitions. The parameters of the revealed energetic levels of quantum wells and of quantum dots can be determined using a row of calculations. The reflection spectra contours are, also, determined using Kamers-Kronig relations, which permit to determine the refractive index n, the extinction coefficient χ, the real (ε1) and imaginary (ε2) part of the complex dielectric constant ε. Patent pending. Exibits Clasification: Class no. 10 Information Technology and Communication

2012-01-01T00:00:00Z ZAPOROJAN, Sergiu CALMÎCOV, Igor PAVEL, Victor LARIN, Vladimir CĂRBUNE, Viorel https://repository.utm.md/handle/5014/21001 2022-09-02T10:04:37Z 2012-01-01T00:00:00Z

Computer aided system for measuring the parameters of bi-stable magnetic wires ZAPOROJAN, Sergiu; CALMÎCOV, Igor; PAVEL, Victor; LARIN, Vladimir; CĂRBUNE, Viorel The system contains a sensor, a specialized device for data acquisition and digital processing, and a host computer. The specialized device provides the operation of signal conditioning, analog to digital conversion, and its real time processing. The host computer provides the visualization and storage of the signal as well as the monitoring and configuration of the device via universal serial bus USB. Patent pending. Exibits Clasification: Class no. 10 Information Technology and Communication

2012-01-01T00:00:00Z NASTAS, Vitalie NICOLAEV, Pavel https://repository.utm.md/handle/5014/21000 2022-09-02T09:53:07Z 2012-01-01T00:00:00Z

Cycle of inventions "Cartesian and polar coordinates meters of impedance" NASTAS, Vitalie; NICOLAEV, Pavel The cycle of invention presents two methods for highprecision measurement of impedance: in Cartesian coordinates (MD489Z) and in polar coordinates (MD392Z), impedancemeters with simulated resonance for their practical implementation (MD445Z, MD444Z), and two impedance converters, used in impedancemeters as reference elements (MD489Z, MD392Z). Patent no. MD 248Z, MD 392Z, MD 420Z, MD 444Z, MD 445Z, MD 489Z. Exibits Clasification: Class no. 5 Industrial and laboratory equipments.

2012-01-01T00:00:00Z